Dimensional Inspection: Surface Finish Analysis
IIA HAS EXTENSIVE EXPERIENCE IN THE DIMENSIONAL INSPECTION OF A WIDE VARIETY OF PRECISION COMPONENTS
IIA offers advanced surface finish analysis and surface mapping and metrology capabilities including graphical depictions, numerous sensor configurations, many algorithm and post-processing options, and even the raw surface finish data. All surface finish measurements comply with ASME-B46.1.
How we acquire surface finish data:
- Skidded 2D Contact Profilometry – This type of measurement process involves a gage with a sensitive stylus contained within a probe attached to a metal rest pad or skid that rests on the object being analyzed. The stylus and skid move together to measure the average roughness of the part’s surface.
- Skidless 2D & 3D Contact Profilometry – Skidless surface finish analysis is a contact measurement method of acquiring finish data with a stylus. Because the skidless gages use an internal precision reference surface, these gages can measure form and waviness in addition to roughness on a micro-inch level.
- Noncontact 2D & 3D Optical Profilometry – This profilometry is a non-contact method which accommodates many sample geometries via chromatic confocal technology which uses white light to collect measurement data. However, whereas interferometry uses the superposition of waves after they are reflected off the object, chromatic confocal sensors measure the wavelength as it hits the surface of the object.
- Nano Scanning – Nano Scanning involves 3D scanning at the sub-micron level and is accomplished with a chromatic confocal sensor. This type of scanning can be used to measure or digitize very small geometry and can also acquire surface roughness data.
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