Dimensional Inspection: Nano Measurement

IIA HAS EXTENSIVE EXPERIENCE IN THE DIMENSIONAL INSPECTION OF A WIDE VARIETY OF PRECISION COMPONENTS

Mainstream metrology has gradually outgrown the limits of the “micro” and is increasingly expanding into the realm of the “nano” for advanced microscopy and analysis. With the advent of nanotechnologies and growing demand for micro-manufacturing, the need for the ability to accurately measure very small objects and geometry has increased the need for measurement beyond the micro, to the nano.

Typically, surface finish has required the highest precision in dimensional metrology. However, the need to characterize surface conditions has steadily moved beyond what conventional surface finish 2D analyzers can measure, which has caused an increasing rise in the need for nano measurement. While specifications for 3D surface finishes have existed for some time, they have rarely been specified in engineering drawings due to the inability to easily obtain such measurements that nano measurement can provide.

IIA provides a variety of nano measurement capabilities and inspection services. In addition to surface finish in 2D and 3D, now very small geometry can be dimensionally characterized and inspected. The technology utilized ranges from stylus profilers to confocal laser microscopy to white light interferometric optical profilometry. Relevant characteristics include flatness, wear, texture, sharpness, and other conditions that can affect functionality but might not otherwise show up in a dataset of conventional metrology measurements.

Practical applications include:

  • Surface finishes
  • Bearings
  • Medical blades
  • Seals
  • Precision valves
  • Artificial joints
  • Inkjet cartridges
  • Extremely small parts

Outputs can range from simple surface finish readings to full 3D analysis. Obtained data can also be provided in formats ranging from a point cloud to fully parametric 3D CAD models.