Dimensional inspection is employed to measure a broad range of sample types in almost every industry imaginable. This same versatility is required at the Nano scale, which is why ongoing effort is put into the development of new measurement technologies.
The combination of stylus profilometers, chromatic confocal technology, interferometry, and other types of sensors enables the collection of multiple types of data at the Nano level. The ability to use various sensor types, sometimes even for the same sample, makes measuring objects with varying characteristics possible. For example, although using a stylus profilometer to measure an object with a soft surface may not be possible, an optical sensor can solve the problem.
Some of the types of measurements that can be obtained at the Nano scale include:
These are not the only types of measurements that can be obtained at the Nano scale. The use of multiple types of sensors and the ongoing development of new nano measurement technology are continually expanding the possibilities for manufacturers and researchers.
If you require any of these types of Nano measurements, or if you’re not sure what approach is needed, the experts at IIA are here to help. We’ll work closely with you through every step of the process to ensure that you get the best results for your application. Contact us anytime if you have questions, or when you’re ready to get started.
Simply fill out your name, number, and email below and someone from our team will contact you within 24 hours.