Surface finish analysis is one of the most common applications of nano measurement, primarily because this field requires a high level of precision. Specialized equipment is necessary because traditional dimensional inspection technology is not able to capture surface characteristics such as texture, sharpness, flatness, and wear at the Nano level. In many applications, the surface conditions are not important, but in some cases they can affect functionality; therefore, meeting certain specifications is critical.
In the past, 2D surface finish profilometers were one of the only ways to collect data and deliver topographical information. Although this data is useful, it imposes limitations on manufacturers and engineers because they are not able to verify specifications for 3D surface finishes.
The availability of newer Nano measurement technologies is changing the landscape of surface finish analysis, making it possible to achieve full 3D analysis.
Some of the features that Nano measurement equipment is able to capture include:
Using a combination of technologies, IIA can deliver simple surface finish readings, full 3D analyses with visualizations, raw point cloud data, and even fully parametric 3D CAD models of very small and complex geometry at the Nano level. If you are looking for a provider that offers a wide variety of high-precision Nano measurement, contact us today to get started.
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